JPH0548573B2 - - Google Patents
Info
- Publication number
- JPH0548573B2 JPH0548573B2 JP60130902A JP13090285A JPH0548573B2 JP H0548573 B2 JPH0548573 B2 JP H0548573B2 JP 60130902 A JP60130902 A JP 60130902A JP 13090285 A JP13090285 A JP 13090285A JP H0548573 B2 JPH0548573 B2 JP H0548573B2
- Authority
- JP
- Japan
- Prior art keywords
- scale
- reference line
- length
- display
- sample image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60130902A JPS61290641A (ja) | 1985-06-18 | 1985-06-18 | 試料像のスケール目盛表示装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60130902A JPS61290641A (ja) | 1985-06-18 | 1985-06-18 | 試料像のスケール目盛表示装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61290641A JPS61290641A (ja) | 1986-12-20 |
JPH0548573B2 true JPH0548573B2 (en]) | 1993-07-21 |
Family
ID=15045392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60130902A Granted JPS61290641A (ja) | 1985-06-18 | 1985-06-18 | 試料像のスケール目盛表示装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61290641A (en]) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6476913B1 (en) * | 1998-11-30 | 2002-11-05 | Hitachi, Ltd. | Inspection method, apparatus and system for circuit pattern |
JP2001357812A (ja) * | 2000-06-12 | 2001-12-26 | Jeol Ltd | 試料観察画像表示装置 |
CN106643508A (zh) * | 2017-02-28 | 2017-05-10 | 成都中科创达软件有限公司 | 一种用于规则三维对象体积测量的方法和系统 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5543587B2 (en]) * | 1974-12-06 | 1980-11-07 | ||
JPS5347262A (en) * | 1976-10-09 | 1978-04-27 | Akashi Seisakusho Kk | Device for indicating scale of scanning electron microscope |
JPS5851664B2 (ja) * | 1979-03-28 | 1983-11-17 | 株式会社日立製作所 | 試料像表示装置 |
JPS6086907U (ja) * | 1983-11-18 | 1985-06-14 | 日本電子株式会社 | 電子線像表示装置 |
-
1985
- 1985-06-18 JP JP60130902A patent/JPS61290641A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61290641A (ja) | 1986-12-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100561655B1 (ko) | 화상표시 방법 및 장치 | |
US4843284A (en) | Method for driving a picture tube with front pane of differing thickness and circuit assembly for executing the method | |
JPH0548573B2 (en]) | ||
JPS5851664B2 (ja) | 試料像表示装置 | |
KR940013166A (ko) | 보정 회로를 포함하는 표시장치 및 그것에 사용하는 보정회로 | |
US3908077A (en) | Method for the determination and/or control of dimensions of an object being supervised by an electronic camera | |
CN110166813A (zh) | 一种显示器多窗口图像独立校正方法及系统 | |
JPS63318054A (ja) | Epmaの測定デ−タ表示方法 | |
EP0021486A1 (en) | Device for displaying an analog signal on a display screen | |
JPH0442777B2 (en]) | ||
DE102009022965A1 (de) | Messung eines Substrats mit elektrisch leitenden Strukturen | |
JPH0442776B2 (en]) | ||
JPH049682A (ja) | 集積回路の導電路上の電位測定方法 | |
JPH10126799A (ja) | コンバージェンス調整方法及びコンバージェンス調整回路 | |
JPS63116348A (ja) | 電子線装置の視野対応装置 | |
JPS6237123Y2 (en]) | ||
SU840952A1 (ru) | Многоканальный функциональныйпРЕОбРАзОВАТЕль | |
JPH0569383B2 (en]) | ||
JPS622168A (ja) | 信号処理装置 | |
JPH0567235B2 (en]) | ||
JP3250287B2 (ja) | 陰極線管のビームスポットの位置ずれの測定方法及び測定装置 | |
JPH10142261A (ja) | 表示装置 | |
JPH10164389A (ja) | 画像表示装置 | |
JPH0223972B2 (en]) | ||
JP2003270271A (ja) | 波形表示における波形表示位置調整装置 |